FEI 20kV SEM -Electron Microscope

Product Description: The FEI Electron Microscope (Model SEC) is designed for high-precision examination and analysis of micro and nanoparticle imaging and the characterization of solid objects. With an accelerating voltage of 20kV and a magnification capacity of up to 100,000x, this microscope offers unmatched detail for scientific research and industrial applications. Equipped with a tungsten light source and electron gun, it ensures high-quality imaging for in-depth analysis. The microscope features digital imaging for clear and precise visualization of the sample. This portable model is perfect for researchers and labs that need flexibility and mobility without sacrificing performance. Product Details: Accelerating Voltage: 20kV (For high-resolution imaging) Magnification: 100,000x (For detailed micro and nanoparticle examination) Brand: FEI (Renowned for high-quality electron microscopes) Usage/Application: For examination and analysis of micro and nanoparticle imaging, characterization of solid objects (Ideal for research and materials analysis) Light Source: Tungsten (Provides reliable, high-quality imaging) Electron Gun: Tungsten (For optimal electron beam generation) Model Name/Number: SEC (High-performance electron microscope model) Microscope Type: Electron Microscope (For detailed electron imaging) Digital Imaging: Yes (For precise digital visualization and analysis) Is It Portable: Portable (Convenient for use in different locations) Minimum Order Quantity: 1 Piece (Available for individual orders)