Scanning Ion Conductance Microscopy For Precision Study

Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe technique used to obtain high-resolution, three-dimensional images of soft, delicate, or living samples in their natural liquid environment. It operates by measuring changes in ionic current as a nanopipette probe approaches the sample surface, avoiding physical contact and preventing damage. SICM is especially valuable in cell biology, physiology, and nanomedicine for studying live cell membranes, surface topography, and dynamic biological processes.