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Conductive AFM Applications in Semiconductor Research
Ψ₯.Ψ― 8520.00 - Ψ₯.Ψ― 8530.00 (AED)| Minimum order quantity |
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Products Description
Conductive atomic force microscopes are specialized AFMs that combine high-resolution surface imaging with the ability to measure local electrical conductivity. A conductive probe scans the sample surface, providing simultaneous topographical and electrical property maps at the nanoscale.
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