Structured Illumination Microscopy Advanced Imaging Tool

Structured Illumination Microscopy (SIM) is a super-resolution imaging technique that enhances the resolution of conventional light microscopy beyond the diffraction limit. It works by projecting patterned light (such as grids or stripes) onto the specimen and capturing multiple images with different illumination patterns and orientations. Computational reconstruction of these images extracts high-frequency spatial information, effectively doubling the resolution of standard fluorescence microscopy (down to ~100 nm).