Scanning Transmission Electron Microscopes (STEM) are advanced electron microscopy instruments that combine features of both transmission and scanning electron microscopy. In STEM, a finely focused electron beam scans a thin specimen, and transmitted electrons are detected to produce high-resolution images and elemental maps. STEM is widely used in materials science, nanotechnology, and biological research for atomic-scale imaging, crystallography, and chemical analysis. Modern STEM systems often include energy-dispersive X-ray spectroscopy (EDS), electron energy loss spectroscopy (EELS), and advanced detectors for precise structural and compositional characterization.