Focused Ion Beam SEM For High-Resolution Imaging

A Focused Ion Beam (FIB) Scanning Electron Microscope is an advanced imaging and microfabrication tool that combines a scanning electron microscope (SEM) with a focused ion beam system. While the SEM provides high-resolution imaging of surfaces, the FIB uses a focused beam of ions (commonly gallium ions) to precisely mill, etch, or deposit materials at the nanoscale. This dual capability allows both detailed visualization and precise modification of samples.