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Focused Ion Beam FIB Scanning Electron Microscope Guide
£ 2450.00 - £ 2460.00 (GBP)| Minimum order quantity |
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Products Description
A Focused Ion Beam (FIB) Scanning Electron Microscope combines high-resolution SEM imaging with a focused ion beam for precise material removal, deposition, or milling at the micro- and nanoscale. This dual capability allows detailed imaging, 3D reconstruction, and site-specific sample preparation for advanced analysis.
FIB-SEM systems are widely used in materials science, semiconductor research, nanotechnology, and failure analysis, enabling applications such as cross-sectioning, circuit editing, and microstructural characterization.
US
-169552.webp)
-144553.webp)
CN
-491788.webp)
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