Atomic Force Microscopes For Precise Nano Research

Atomic Force Microscopes (AFM) are high-resolution scanning probe microscopes that measure surface topography at the nanometer and even atomic scale. Instead of using light or electrons, AFMs rely on a sharp probe (cantilever tip) that physically interacts with the surface of a specimen. As the tip scans across the sample, forces between the tip and the surface cause the cantilever to deflect. These deflections are detected by a laser beam reflected onto a photodetector, creating a detailed 3D map of the surface.