Atomic Force Microscopes For Nanoscale Surface Study

Atomic Force Microscopes (AFM) are high-resolution scanning probe instruments that map the surface topography of materials at the nanometer and even atomic scale. They operate by scanning a sharp probe tip across a specimen’s surface and measuring the interaction forces between the tip and sample. AFMs provide detailed 3D surface images without requiring special sample preparation and can be used on biological, polymeric, and inorganic materials. Widely applied in nanotechnology, materials science, life sciences, and semiconductor research, AFMs enable analysis of surface roughness, mechanical properties, adhesion, and molecular interactions under ambient, liquid, or vacuum conditions.