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Verified SupplierAtomic Force Microscope AFM - High-Precision Nanoprofiler
₹ 100000.00 - ₹ 150000.00 (INR)
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100
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Products Description
Product Description:
The Nanoprofiler AFM is a cutting-edge Atomic Force Microscope (AFM) designed to analyze technical samples, including wafers and discs with remarkable precision. Offering three customizable sample stage options, it accommodates substrates up to 200 x 200 x 20 mm, making it versatile for a range of sample sizes. The microscope features a high-resolution integrated video microscope that enables clear, real-time visualization of samples.
Equipped with a linearized XY piezoelectric scanner, the Nanoprofiler AFM delivers exceptional scanning resolution, capturing fine details of sample surfaces. The system supports various imaging modes, including vibrating and non-vibrating topography, lateral force, and phase mode imaging, allowing for comprehensive surface characterization. Its direct drive motorized probe approach ensures precise, stable, and accurate measurements. With intuitive LabVIEW™-based software, this AFM system simplifies the process of image capture and analysis, making it a powerful tool for research, development, and quality control in scientific and industrial settings.
Product Details:
Sample Stage Options:
Three stage options for substrates up to 200 x 200 x 20 mm.
Integrated Video Microscope:
High-resolution video microscope for easy visualization of samples.
Scanning Technology:
Linearized XY piezoelectric scanner for high-resolution imaging and surface analysis.
AFM Probe Compatibility:
Accommodates standard-sized AFM probes for flexibility and easy probe integration.
Imaging Modes:
Supports vibrating and non-vibrating topography modes.
Includes lateral force and phase mode imaging for comprehensive surface studies.
Motorized Probe Approach:
Utilizes a direct drive motorized probe for precise, stable interaction with the sample.
Software:
LabVIEW™-based software that provides an intuitive interface for easy image capture and analysis.
Applications:
Ideal for technical samples, wafers, and discs, making it perfect for various research, development, and quality control applications.
