Atomic Force Microscope AFM - High-Precision Nanoprofiler

Product Description: The Nanoprofiler AFM is a cutting-edge Atomic Force Microscope (AFM) designed to analyze technical samples, including wafers and discs with remarkable precision. Offering three customizable sample stage options, it accommodates substrates up to 200 x 200 x 20 mm, making it versatile for a range of sample sizes. The microscope features a high-resolution integrated video microscope that enables clear, real-time visualization of samples. Equipped with a linearized XY piezoelectric scanner, the Nanoprofiler AFM delivers exceptional scanning resolution, capturing fine details of sample surfaces. The system supports various imaging modes, including vibrating and non-vibrating topography, lateral force, and phase mode imaging, allowing for comprehensive surface characterization. Its direct drive motorized probe approach ensures precise, stable, and accurate measurements. With intuitive LabVIEW™-based software, this AFM system simplifies the process of image capture and analysis, making it a powerful tool for research, development, and quality control in scientific and industrial settings. Product Details: Sample Stage Options: Three stage options for substrates up to 200 x 200 x 20 mm. Integrated Video Microscope: High-resolution video microscope for easy visualization of samples. Scanning Technology: Linearized XY piezoelectric scanner for high-resolution imaging and surface analysis. AFM Probe Compatibility: Accommodates standard-sized AFM probes for flexibility and easy probe integration. Imaging Modes: Supports vibrating and non-vibrating topography modes. Includes lateral force and phase mode imaging for comprehensive surface studies. Motorized Probe Approach: Utilizes a direct drive motorized probe for precise, stable interaction with the sample. Software: LabVIEW™-based software that provides an intuitive interface for easy image capture and analysis. Applications: Ideal for technical samples, wafers, and discs, making it perfect for various research, development, and quality control applications.